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Backlighting High lumen 2016 3V 60MA 0.2W 26-28LM 6500K PCT SMD LED CHIP Phone Flash light

Categories SMD LED Chip
Brand Name: PHOENIX
Model Number: 2016
Certification: LM80 CE ROHS
Place of Origin: SUZHOU
MOQ: 16000PCS
Price: Negotiation
Payment Terms: Western Union, MoneyGram, T/T
Supply Ability: 400KK PER MONTH
Delivery Time: 7-10 DAYS
Packaging Details: 4000PCS /ROLL
Name: SMD LED 2016 white color
Luminous Flux(lm): 28-30lm
Color Rendering Index(Ra): 80
Cct: 6500K
Power: 0.2W
nput Voltage(V): 3v
Warranty(Year): 2 years
Working Time (hours): 20000
Operating Temperature(℃): -40-85
Lamp Luminous Efficiency(lm/w): 140
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Backlighting High lumen 2016 3V 60MA 0.2W 26-28LM 6500K PCT SMD LED CHIP Phone Flash light

Backlighting High lumen 2016 3V 60MA 0.2W 26-28LM 6500K PCT SMD LED CHIP Phone Flash light

1.Product Freatures

.Efficacy of 140 lm/W typical for 6500K,CRI 80

.Adopt good quality chip and frame ,antistatic good stability Ultra low attenuation

.High brightness ,low attenuation high color rendering

. Minimum 80, 90 and 95 CRI options

.Strong welding and good stability undead light

.Product series and company logo on the front

. CE ROHS LM80 Certification

.Viewing angle:120 deg
.RoHS compliant lead-free soldering compatible
2.Package Structure



3.Absolute Maximum Ratings

ItemSymbolAbsolute Maximum RatingsUnit
Forward CurrentIF60mA
Reverse VoltageVr5V
Pulsed Forward CurrentIFP*90mA
Power dissipationPD0.2W
Operating TemperatureTOP-40~85
Storage TemperatureTST-40~85
Electrostatic DischargeESD2000(HBM)V
Junction TemperatureTj110
LED Thermal resistanceRth s-j27℃/W


4.Typical Electro-Optical characteristics curves


5.LED Reliability Test List


Test ItemTest ConditionsStandardQty(Pcs)
Life Test25℃,1000Hrs@60mA/22
High Temperature85℃,1000Hrs@60mA/22
Low Temperature-40℃,1000Hrs@60mA/22
High Humidity Heat

85℃,85%RH,

1000Hrs@60mA

/22
Low Temperature Storage-40℃,1000Hrs

JEITA ED-4701

200 202

22
High Temperature Storage100℃,1000Hrs

JEITA ED-4701

200 201

22
Temperature Cycle(-40'C 30mins --25'C(5mins)--100'C(30mins) ,Temp changing rate:3+/-0.6'C/min)

JEITA ED-4701

100 105

22
Thermal Shock-40'C(15mins) --100'C(15mins),changing time <5mins ,300CMIL-STD-202G22
Pulse Life TestTp=1ms,DC=0.1,D=Tp/T @ 3×60mA,1000Hrs/22
ESD Test(HBM)2000V,200V/Step, Forward & Reverse Test both 3times

AEC

(Q101-001)

22
Soldering Resistance

260±5℃,10S,3times

Pre-treatment 30℃,70%RH

JEITA ED-4701

300 302

22
Reflow IV Decay

260±5℃,10S,1time

Pre-treatment 30℃,70%RH,168Hrs

/22
Judgment Criteria
Forward Voltage VFVF Max-Increase < 1.1x
Reverse Current IRIR Max-Increase < IRmax
Luminous Intensity IVIV Decay < 40%
※Solder ability test criteria:coverage is not less than 95%
Note:Measurement shall be taken after the tested samples have been returned to normal ambient conditions (generally after two hours)













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