Four-Channel 24.5 To 29Gb/S Tunable Error Meter For 100G TOSA/ROSA Devices

Four-Channel 24.5 To 29Gb/S Tunable Error Meter For 100G TOSA/ROSA Devices

The four-channel 24.5~29Gb/s tunable bit error tester is a kind of high-precision and cost-effective test equipment, which is mainly used in the field of optical communication error test.

Product overview
The four-channel 24.529Gb/s tunable error meter is a test instrument that integrates the functions of internal reference clock, graphic signal generator, clock recovery circuit and error analysis. It supports four-channel parallel testing, each channel rate up to 24.529Gb/s, suitable for a variety of high-rate communication devices test requirements.

Product characteristics
High precision and high performance: The error tester can provide high precision error testing to ensure the accuracy and reliability of the test results.
Multi-channel parallel testing: Support four-channel parallel testing, improve the test efficiency, especially for the need to test multiple devices at the same time.
Tunability: The rate range can be tuned from 24.5Gb/s to 29Gb/s to meet the test needs of different rate devices.
Integrated design: A variety of test functions are integrated into one, reducing the size and complexity of the equipment, and improving the ease of use.
Rich test functions: In addition to the basic error test, it also supports the eye map test, transmission system bit rate and characteristic test.
Easy to operate: Usually has a friendly user interface and simple operation flow, so that operators can quickly get started and efficiently complete the test task.

Specification

Scope of application
The four-channel 24.5~29Gb/s tunable error meter has a wide range of applications in the field of optical communication, including but not limited to the following aspects:

Optical transceiver module test: such as CFP2, CFP4, QSFP28, SFP+, XFP and other modules error test.
Photoelectric components and equipment testing: such as TOSA, ROSA, laser and other photoelectric components and equipment error test.
High-speed Integrated Circuit and circuit board testing: Used to test the error performance of Gbps class integrated circuits (ICs) and circuit boards (PCBs).
Serial bus and high-speed backplane design tests: Used to verify the signal integrity and bit error rate of the system during the serial bus and high-speed backplane design process.
Optical transmission network installation testing and troubleshooting: Used to test system error performance and troubleshoot faults during the installation and commissioning of optical transmission network.

"To do import substitution, to create national brand" is the journey that Uc Instruments is brave to climb and the goal of continuous progress.

Guangzhou UC Instruments., Co. Ltd. was founded in March 2009 and has been recognized as a high-tech enterprise in Guangdong Province.

Guangzhou UC Instruments., Co. Ltd. is willing to join hands with chip manufacturers, device manufacturers, equipment manufacturers, communication operators and data centers in the optical communication industry, as well as teaching and research units in the industry, to create a brilliant industry. To provide industry users with "UC" independent brand measurement instrument products and services, and automated test system customization services.

We warmly invite customers to choose our products and services. We will try our best to do a good job in the spirit of craftsmanship in our products, with enthusiasm to do a good job in our services, and strive to become the majority of users in the field of product measurement and testing strong backing.

The full range of Youxi instrument products are:

8 series passive measuring equipment: light source series, optical power meter series, optical attenuator series, plug back loss meter series and optical polarization generator and optical switch series, etc.

9 series of active measuring equipment: BER series, optical oscilloscope series, clock recovery instrument series, LIV measuring system and 10G/100G/400G optical module test and evaluation board series.