| 7-1 Insulation Resistance | Unmated connectors, apply 100Volts DC between adjacent terminals or
shell ground. | EIA 364-21C | 100M minimum (unmated) between adjacent contacts and contacts and
ground. |
| 7-2 Low Level Contact Resistance | 20mV Max. open circuit at 100mA Max. | EIA 364-23b | 40m(Max) initial for VBUS and GND contacts and all other contacts;
delta 10m(Max) after test. |
| 7-3 Dielectric Withstanding Voltage | Subjected to 100VAC (RMS) for 1 minute between adjacent terminals. | EIA 364-20 | There shall be no breakdown. |
| 7-4 Contact current rating | 5.0A shall be applied collectively to VBUS pins and 1.25 A applied
to the VCONN pin and 0.25 A the other contacts. When the currents
are applied to the contacts, the temperature rise shall not exceed
30 C at any point on the USB Type-C mated plug and receptacle under
test, when measured at an ambient temperature of 25 C. | EIA364-70 | - |
| Cycle Test | Type C: 10000 cycles | EIA 364-09 | Must meet the following criteria after the cycle test is completed:
Contact resistance (40m > delta 10m (Max) after test), Insertion
force (5N to 20N), Extraction force (8N to 20N), Visual inspection
(no exposed base metal on contacts). |
| Cable Flexing | 100 cycles in each of 2 planes 120 degree. Dimension x=3.7x cable
diameter | EIA 364-41 | No discontinuity over 1 microsecond during flexing or physical
damage allowed. |
| Cable Pull-Out | 40N steady state axial load for 1 minute | EIA-364-38 | No discontinuity or physical damage allowed. |
| 4-axes continuity test | 8N tensile force for a period of 10 seconds; The specimen must
subject to 0, 90, 180, 270 direction. | EIA364-18 | No discontinuity greater than 1s and no physical damage to the
specimen (one cable per test). |
| Temperature Life | 105 C without applied voltage for 120 hours. 105 C without applied
voltage for 72 hours when used as preconditioning in EIA
364-1000.01. | EIA 364-17 | Visual inspection, Test shall be done in sequences defined in EIA
364-1000.01. |
| Thermal Shock | 10 Cycles -55C and +85C. The USB 3.0 connectors under test must be
mated. | EIA 364-32 | There shall be no evidence of any physical damage. |
| Salt Spray | Subject mated connectors to 48 hours at 35C with 5%-Salt-solution
concentration. | MIL-STD-202F, Method 101D, Test Condition B | 1). Shall meet visual requirement, show no physical damage. 2).
Shall meet requirements of additional tests as specified in test
sequence in Section 5. |
