fj39 2180 surface contamination detector

Brand Name:HUATEC

Model Number:FJ39-2060

Place of Origin:China

Surface contamination measurement instrument FJ39-2060 Introduction FJ39-2060 α,β Measuring instrument is suitable for the low levels α,β Radiation surface contamination detection.The instrument adopt double flash detector,has the high detection ...

Place of Origin:Beijing

Brand Name:HUATEC

Model Number:HRD Series

...surface contamination measuring instrument HRDmu-I Both α/β surface measurement and environment contamination γ measurement characteristics can store 100, 000 bunches of data, and has data communication function. it is easy to read the numerical value and simulation barcode show. it is light and easy to use, and high reliability HRDmu-I adopts semiconductor detector. It is suitable for low level α β surface radiation contamination

Brand Name:Raytech

Model Number:RD610

Place of Origin:China

Surface Contamination Monitor, Radiation Monitor, Contamination Detector, Radioactive Counter RD610 Application: Environmental protection bureau, public health bureau, inspection and quarantine bureau, radiology department of hospital, radio action ...

Brand Name:JOVI

Model Number:1-CF-30

Place of Origin:China

Product Description: The JOVI-1034M α, β surface contamination meter is capable of continuously monitoring α, β rays in the environment, providing real-time αβ dose rate values. The 1034M α,β Surface Contamination Meter is capable of continuous monitoring...

Brand Name:KEYE

Model Number:KY-P-C

Place of Origin:China

‌Technical Focus‌: ‌Ultra-high-resolution OCT‌ (1.3μm axial resolution): Detects micro-cracks in glass necks (≥2μm depth) Measures inner surface roughness (Ra ≤0.4μm) ‌Vacuum decay testing‌ integrated with vision (10 Pa resolution) ‌Deep learning particle ...

Brand Name:Lixian

Model Number:HZ-1728

Place of Origin:China

...model belongs to a detection device, in particular to a polished surface detector which can effectively detect tiny defects and contamination on a wafer surface or a wafer subsurface. With the rapid development of microelectronics technology, the number of