Durable Clamshell Socket For High Temperature And High Humidity Aging Tests

Our clamshell IC sockets feature a robust flip-top design for easy loading/unloading, making them ideal for high-temperature (+125 °C+) and high-humidity (85% RH) aging tests:

• ✔ High-Reliability Contacts - Choose between pogo pin or spring probe designs for stable electrical connections in harsh environments.
• ✔ Durable Clamshell Mechanism - Reinforced hinges ensure smooth operation even after thousands of cycles under stress.
• ✔ Sealed & Reinforced Housings - Engineered to resist oxidation and moisture damage in prolonged aging tests.

Available in custom pin layouts & force settings--optimized for BGA, QFN, and other advanced IC packages.

• Superior Durability - Built for high-cycle testing with robust materials that withstand thousands of insertions
• Broad Compatibility - Supports BGA, QFN, SOP, and other IC packages
• Precision Contact Technology - Low-resistance spring probes or pogo pins for reliable electrical connections
• Custom Configurations - Tailored test fixtures for unique IC designs and testing requirements
• Thermal & High-Frequency Options - Specialized sockets for burn-in, high-temp, and RF testing

IC Test Socket Solutions - Precision Testing for Demanding Applications
Whether you're validating prototypes, programming ICs, or running high-volume production tests, our custom test sockets ensure accuracy and repeatability. Engineered for challenging environments, our sockets feature robust mechanical designs to prevent warping under thermal stress while maintaining stable contact resistance. Compatible with automated handlers and testers, they streamline your validation process while cutting downtime.