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Heat Dissipation Semiconductor Test Socket Reliable Open Top Type

Categories IC Test Sockets
Brand Name: Sireda
Model Number: Open Top
Certification: ISO9001
Place of Origin: China
MOQ: 1
Price: Get Quote
Pitch: ≥0.3mm
Pin Count: 2-2000+
Compatible Packages:: BGA, QFN, LGA, SOP, WLCSP
Socket Type: Open Top
Conductor Type: Probe Pins, Pogo Pin, PCR
Features: Highly customizable
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Heat Dissipation Semiconductor Test Socket Reliable Open Top Type

High-Temperature Test Sockets with Superior Heat Dissipation
  • Advanced Heat Dissipation
    Specially designed for stable operation up to 150 °C+, preventing thermal drift in power device and automotive testing.
  • Extended Burn-In Durability
    Engineered for 200+ hours of continuous validation with minimal contact degradation.
High-temperature test socket Test socket close-up
Key Features & Benefits:
  • Superior Durability - Built for high-cycle testing with robust materials that withstand thousands of insertions
  • Broad Compatibility - Supports BGA, QFN, SOP, and other IC packages
  • Precision Contact Technology - Low-resistance spring probes or pogo pins for reliable electrical connections
  • Custom Configurations - Tailored test fixtures for unique IC designs and testing requirements
  • Thermal & High-Frequency Options - Specialized sockets for burn-in, high-temp, and RF testing
IC Test Socket Technical Image
Custom Test Socket: Core Specifications

Property

Parameter

Typical Value

Mechanical

Insertion Cycles

≥30K–50K cycles

Contact Force

20–30g/pin

Operating Temperature

Commercial -40 ~ +125
Military -55 ~ +130

Tolerance

±0.01mm

Electrical

Contact Resistance

<50mΩ

Impedance

50Ω (±5%)

Current

1.5A~3A

IC Test Socket Solutions - Precision Testing for Demanding Applications

Whether you're validating prototypes, programming ICs, or running high-volume production tests, our custom test sockets ensure accuracy and repeatability. Engineered for challenging environments, our sockets feature robust mechanical designs to prevent warping under thermal stress while maintaining stable contact resistance. Compatible with automated handlers and testers, they streamline your validation process while cutting downtime.

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